Describe the GB / T11158-2008 standard for high and low temperature test chamber
The high and low temperature test box produced by the high and low temperature test box is manufactured in strict accordance with the high temperature aging test methods of GB / T2423.2-2008 and GB / T11158-2008. GB / T11158-2008 (High Temperature Test) stipulates the terms and definitions of the high temperature test chamber, the use conditions, technical requirements, test methods, inspection rules and signs, packaging, storage of the high temperature test chamber. It is suitable for high-temperature test chambers for electricians, electronics and other products, parts and materials. The high temperature test specified in this part of GB / T 2423 is applicable to non-heat dissipation and heat dissipation test samples.
The purpose of this high temperature test is limited to determining the ability of components, equipment or other products to be used, transported or stored under high temperature.
This high temperature test method is subdivided into the following types:
High temperature test of non-heat dissipation test sample:
Test Bb, temperature gradient.
High temperature test of heat dissipation test sample:
Test Bd, temperature gradient;
Test Be, temperature gradual change, the test sample is energized throughout the test process.
The test methods given in this section are generally used for test samples that reach temperature stability during the test.
In order to facilitate customers to use the high and low temperature test chamber, they can maintain and maintain the equipment correctly and improve the service life of the equipment. Here, the editor introduces the two problems that often occur in the high and low temperature test chamber.
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